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晶體尺寸：~8毫米
電學性能：半導體
晶體結構：單斜晶系
晶胞參數(shù)：a = 0.541 nm, b = 0.375 nm, c = 0.944 nm, α = γ = 90°, γ = 97.50°
晶體類型：合成
晶體純度：＞99.995%
X-ray diffraction on a ZrSe3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 3, 4, 5, 6, 7, 8
Powder X-ray diffraction (XRD) of a single crystal ZrSe3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.
Raman spectrum of a single crystal ZrSe3. Measurement was performed with a 785 nm Raman system at room temperature.
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